Automatic Optical Inspection System
VL1000 V series
Key Features
Dual magazine loading system.
Dual indexing XY stage for high throughput.
On-the-fly scanning megapixel camera inspection systems.
GUI and Recipe Management for quick-setup.
SEMI E142 or XML text format interface strip mapping communication platform.
Defect classification included lead punch, wire break mechanism and ink-marking.
SECS/GEM or TCP/IP via host communication platform.
DEFECT DETECTS –
Wires: missing, damaged, off pad, club foot
Die: missing, wrong, chipped, cracked, contamination
Part: position, missing, wrong, polarity, skew, tombstone
Epoxy: contamination, insufficient, excessive, bridging
Solder: contamination, insufficient, excessive, bridging
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