A large travel, high accuracy dimensional metrology system
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The VIEW Benchmark 250 delivers the high performance and reliability you expect from VIEW Micro-Metrology in a compact, benchtop package. Its advanced optics, illumination, available through-the-lens laser, and image processing capabilities make it a world-class metrology system.
Benchmark 250 is equally at home in the QA lab performing first article inspection or on the production floor providing precision measurements for process control.
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Featuring:：
300 x 150 x 150 mm measuring range
25 kg (55 lbs) maximum load
Sub-micron scale resolution
Stage Drive Velocity X-Y: 150 mm/sec; Z: 100 mm/sec
Stage Error Mapping: Non-linear 2D error corrections in X-Y plane
High-precision dual magnification optical system
Optional Programmable Multi-Color Ring Light (PRL)
Optional through-the-lens (TTL) laser with autofocus and scanning capabilities
Advanced image processing for high speed, accuracy and robustness
Dual, digital, 1.4 megapixel monochrome cameras; 4:1 ratio
Subpixel accuracy of 1/10 to 1/50 pixel
Choice of powerful metrology software and data analysis tools
MTBF ≥ 8,000 hours
Applications for Benchmark include：
. Semiconductor/Electronics
BGA, μBGA, CSP, flip-chip, MCM, bump-on-die
Lead frames, wire bonds, flex circuits, connectors
SMT component placement
Solder paste/Epoxy glue dot
Chip carriers and trays
Inkjet printer cartridges
Fiber optic components and MEMs
. Data Storage
Suspensions
Slider and Head Gimble Assemblies (HGA)
Disk media substrates
. Precision plastic molded and machined parts
Dies and tooling
Medical devices
Fuel injection components
Watch components
